LSI and Systems Workshop 2025: Poster Award
I presented our cryogenic CMOS measurement and modeling work and received the Outstanding Poster Award in the student category.
In May 2025, I presented a poster at the LSI and Systems Workshop 2025 in Tokyo. The presentation was titled Measurement and Modeling of Current Characteristics Using Forward Body Biasing in Bulk CMOS Transistors at Cryogenic Temperatures. It received the Outstanding Poster Award in the student category.
Research overview
The poster examined forward body biasing as a way to compensate for the threshold-voltage increase of bulk CMOS transistors at cryogenic temperatures. We presented:
- current measurements obtained with our cryogenic probing setup;
- the usable forward-bias range and the onset of parasitic conduction; and
- compact-modeling results for the measured characteristics.
